[1]
P. Mints, SPV market research, the global market for pv technologies, in: 9th Photovoltaic Science Application and Technology Conference and Exhibition, (2012).
Google Scholar
[2]
A. A. Istratov, T. Buonassisi, R. J. McDonald, A. R. Smith, R. Schindler, J. A. Rand, J. P. Kalejs, E. R. Weber, Metal content of multicrystalline silicon for solar cells and its impact on minority carrier diffusion length, J. Appl. Phys. 94 (2003).
DOI: 10.4028/www.scientific.net/ssp.95-96.175
Google Scholar
[3]
T. Buonassisi, A. A. Istratov, M. D. Pickett, M. Heuer, J. P. Kalejs, G. Hahn, M. A. Marcus, B. Lai, Z. Cai, S. M. Heald, T. F. Ciszek, R. F. Clark, D. W. Cunningham, A. M. Cabor, R. Jonczyk, S. Narayanan, E. Sauar, E. R. Weber, Chemical natures and distributions of metal impurities in multicrystalline silicon materials, Prog. Photovoltaics res. appl. 14 (2006).
DOI: 10.1002/pip.690
Google Scholar
[4]
V. Kveder, M. Kittler, W. Schroter, Recombination activity of contaminated dislocations in silicon: a model describing electron-beam-induced current contrast behavior, Phys. Rev. B 63 (2001) 115208.
DOI: 10.1103/physrevb.63.115208
Google Scholar
[5]
J. Murphy, K. Bothe, V. Voronkov, R. Falster, On the mechanism of recombination at oxide precipitates in silicon, Appl. Phys. Lett. 102 (4) (2013) 042105.
DOI: 10.1063/1.4789858
Google Scholar
[6]
R. Kvande, B. Geerligs, G. Coletti, L. Arnberg, M. D. Sabatino, E. J. Ovrelid, C. C. Swanson, Distribution of iron in multi-crystalline silicon ingots, J. Appl. Phys. 104 (2008) 064905.
DOI: 10.1063/1.2956697
Google Scholar
[7]
E. Olsen, E. Øvrelid, Silicon nitride coating and crucible effects of using upgraded materials in the casting of multicrystalline silicon ingots, Prog. Photovoltaics res. appl. 16 (2) (2008) 93-100.
DOI: 10.1002/pip.777
Google Scholar
[8]
T. U. Nerland, L. Arnberg, A. Holt, Origin of the low carrier lifetime edge zone in multicrystalline pv silicon, Prog. Photovoltaics res. appl. 17 (2008) 289 - 296.
DOI: 10.1002/pip.876
Google Scholar
[9]
D. Macdonald, A. Cuevas, A. Kinomura, Y. Nakano, L. J. Geerligs, Transition-metal profiles in a multicrystalline silicon ingot, J. Appl. Phys. 97 (2005) 033523-1 - 033523-7.
DOI: 10.1063/1.1845584
Google Scholar
[10]
T. Buonassisi, A. A. Istratov, M. Heuer, M. A. Marcus, R. Jonczyk, J. Isenberg, B. Lai, Z. Cai, S. Heald, W. Warta, R. Schindler, G. Willeke, E. R. Weber, Synchrotron-based investigations of the nature and impact of iron contamination in multicrystalline silicon solar cells, J. Appl. Phys. 97 (2005).
DOI: 10.1063/1.1866489
Google Scholar
[11]
B. L. Sopori, L. Jastrzebski, T. Tan, A comparison of gettering in single-and multicrystalline silicon for solar cells, in: Proc. 25th IEEE PVSC, Washington, D.C., 1996, p.625.
DOI: 10.1109/pvsc.1996.564206
Google Scholar
[12]
S. Rein, S. W. Glunz, Electronic properties of interstitial iron and iron-boron pairs determined by means of advanced lifetime spectroscopy, J. Appl. Phys. 98 (2005) 113711.
DOI: 10.1063/1.2106017
Google Scholar
[13]
P. Gundel, M. C. Schubert, F. D. Heinz, W. Kwapil, W. Warta, G. Martinez-Criado, M. Reiche, E. R. Weber, Impact of stress on the recombination at metal precipitates in silicon, J. Appl. Phys. 108 (10) (2010) 103707.
DOI: 10.1063/1.3511749
Google Scholar
[14]
T. Buonassisi, A. Istratov, M. Marcus, B. Lai, Z. Cai, S. Heald, E. Weber, Engineering metal-impurity nanodefects for low-cost solar cells, Nat. Mater. 4 (2005) 676-679.
DOI: 10.1038/nmat1457
Google Scholar
[15]
D. P. Fenning, J. Hofstetter, M. I. Bertoni, G. Coletti, B. Lai, C. del Canizo, T. Buonassisi, Precipitated iron: A limit on gettering efficacy in multicrystalline silicon, J. Appl. Phys. 113 (4) (2013) 044521.
DOI: 10.1063/1.4788800
Google Scholar
[16]
D. M. Powell, D. P. Fenning, J. Hofstetter, J. F. Lelievre, C. d. Canizo, T. Buonassisi, TCAD for PV - a fast method to accurately model metal impurity evolution during solar cell processing, PV International 15 (2012) 91.
Google Scholar
[17]
J. Hofstetter, J. F. Leliévre, C. del Cañizo, A. Luque, Study of internal versus external gettering of iron during slow cooling processes for silicon solar cell fabrication, Solid State Phenomena 156-158 (2010) 387-393.
DOI: 10.4028/www.scientific.net/ssp.156-158.387
Google Scholar
[18]
D. P. Fenning, J. Hofstetter, M. I. Bertoni, S. Hudelson, M. Rinio, J. F. Lelièvre, B. Lai, C. del Cañizo, T. Buonassisi, Iron distribution in silicon after solar cell processing: Synchrotron analysis and predictive modeling, Appl. Phys. Lett. 98 (2011).
DOI: 10.1063/1.3575583
Google Scholar
[19]
J. -F. Lelievre, J. Hofstetter, A. Peral, I. Hocesc, F. Recart, C. del Canizo, Dissolution and gettering of iron during contact co-firing, Energy Procedia 8 (2011) 257 - 262.
DOI: 10.1016/j.egypro.2011.06.133
Google Scholar
[20]
J. Hofstetter, D. P. Fenning, J. -F. Lelièvre, C. del Cañizo, T. Buonassisi, Engineering metal precipitate size distributions to enhance gettering in multicrystalline silicon, phys. stat. sol. (a) 209 (10) (2012) 1861- -1865.
DOI: 10.1002/pssa.201200360
Google Scholar
[21]
D. P. Fenning, A. S. Zuschlag, M. I. Bertoni, B. Lai, G. Hahn, T. Buonassisi, Improved iron gettering of contaminated multicrystalline silicon by high-temperature phosphorus diffusion, J. Appl. Phys. 113 (2013) 214504.
DOI: 10.1063/1.4808310
Google Scholar
[22]
D. H. Macdonald, L. J. Geerligs, A. Azzizi, Iron detection in crystalline silicon by carrier lifetime measurements for arbitrary injection and doping, J. Appl. Phys. 95 (3) (2004) 1021-1028.
DOI: 10.1063/1.1637136
Google Scholar
[23]
J. Hofstetter, D. P. Fenning, M. I. Bertoni, J. F. Lelièvre, C. del Cañizo, T. Buonassisi, Impurity-toefficiency simulator: Predictive simulation of silicon solar cell performance based on iron content and distribution, Prog. Photovoltaics Res. Appl. 19 (2010).
DOI: 10.1002/pip.1062
Google Scholar
[24]
J. Hofstetter, J. F. Lelièvre, D. P. Fenning, M. I. Bertoni, T. Buonassisi, C. del Cañizo, Towards the tailoring of p diffusion gettering to as-grown silicon material properties, Solid State Phenomena 178 (2011) 158-165.
DOI: 10.4028/www.scientific.net/ssp.178-179.158
Google Scholar
[25]
Impurities-to-Efficiency (I2E) simulator, online applet, http: /pv-i2e. mit. edu.
Google Scholar
[26]
H. Hieslmair, S. Balasubramanian, A. A. Istratov, E. R. Weber, Gettering simulator: physical basis and algorithm, Semiconductor Science and Technology 16 (2001) 567-574.
DOI: 10.1088/0268-1242/16/7/307
Google Scholar
[27]
C. del Canizo, A. Luque, A comprehensive model for the gettering of lifetime-killing impurities in silicon, J. Electrochem. Soc. 147 (2000) 2685-2692.
DOI: 10.1149/1.1393590
Google Scholar
[28]
M. Seibt, A. Sattler, C. Rudolf, O. Voss, V. Kveder, W. Schroter, Gettering in silicon photovoltaics: current state and future perspectives, phys. stat. sol. (a) 203 (2006) 696.
DOI: 10.1002/pssa.200664516
Google Scholar
[29]
A. Bentzen, A. Holt, R. Kopecek, G. Stokkan, J. S. Christensen, B. G. Svensson, Gettering of transition metal impurities during phosphorus emitter diffusion in multicrystalline silicon solar cell processing, J. Appl. Phys. 99 (2006) 093509.
DOI: 10.1063/1.2194387
Google Scholar
[30]
A. Haarahiltunen, H. Vainola, O. Anttila, E. Saarnilehto, M. Yli-Koski, J. Storgards, J. Sinkkonen, Modeling of heterogeneous precipitation of iron in silicon, Appl. Phys. Lett. 87 (2005) 151908.
DOI: 10.1063/1.2099531
Google Scholar
[31]
J. Schon, H. Habenicht, M. C. Schubert, W. Warta, Understanding the distribution of iron in multicrystalline silicon after emitter formation: Theoretical model and experiments, J. Appl. Phys. 109 (6) (2011) 063717.
DOI: 10.1063/1.3553858
Google Scholar
[32]
R. Chen, H. Wagner, A. Dastgheib-Shirazi, M. Kessler, Z. Zhu, V. Shutthanandan, P. P. Altermatt, S. T. Dunham, A model for phosphosilicate glass deposition via pocl 3 for control of phosphorus dose in si, J. Appl. Phys. 112 (12) (2012) 124912.
DOI: 10.1063/1.4771672
Google Scholar
[33]
J. D. Murphy, R. J. Falster, http: /dx. doi. org/10. 1002/pssr. 201105388Contamination of silicon by iron at temperatures below 8000c, phys. stat. sol. RRL 5 (10-11) (2011).
Google Scholar
[34]
J. D. Murphy, R. J. Falster, The relaxation behaviour of supersaturated iron in single-crystal silicon at 500 to 7500 c, J. Appl. Phys. 112 (11) (2012) 113506.
DOI: 10.1063/1.4767378
Google Scholar
[35]
G. Coletti, R. Kvande, V. D. Mihailetchi, L. J. Geerligs, L. Arnberg, E. J. Ovrelid, Effect of iron in silicon feedstock on p- and n-type multicrystalline silicon solar cells, J. Appl. Phys. 104 (2008) 104913.
DOI: 10.1063/1.3021355
Google Scholar
[36]
J. Harkonen, V. -P. Lempinen, T. Juvonen, J. Kylmaluoma, Recovery of minority carrier lifetime in lowcost multicrystalline silicon, Sol. Energ. Mat. Sol. Cells 73 (2003) 125-130.
DOI: 10.1016/s0927-0248(01)00117-9
Google Scholar
[37]
P. Manshanden, L. Geerligs, Improved phosphorous gettering of multicrystalline silicon, Sol. Energy Mater. Sol. Cells 90 (2006) 998-1012.
DOI: 10.1016/j.solmat.2005.05.015
Google Scholar
[38]
J. Tan, A. Cuevas, D. Macdonald, N. Bennett, I. Romijn, T. Trupke, R. Bardos, Optimised gettering and hydrogenation of multi-crystalline silicon wafers for use in solar cells, in: Proc. 22nd EUPVSEC, Milan, Italy, 2007, pp.1309-1313.
Google Scholar
[39]
M. D. Pickett, T. Buonassisi, Iron point defect reduction in multicrystalline silicon solar cells, Appl. Phys. Lett. 92 (2008) 122103.
DOI: 10.1063/1.2898204
Google Scholar
[40]
M. Rinio, A. Yodyunyong, S. Keipert-Colberg, Y. P. B. Mouafi, D. Borchert, A. Montesdeoca-Santana, Improvement of multicrystalline silicon solar cells by a low temperature anneal after emitter diffusion, Prog. Photovoltaics Res. Appl. 19 (2010).
DOI: 10.1002/pip.1002
Google Scholar
[41]
J. Hofstetter, D. P. Fenning, T. Buonassisi, Toward customizing the solar cell process to as-grown silicon material properties, unpublished.
Google Scholar
[42]
P. Plekhanov, R. Gafiteanu, U. Gösele, T. Tan, Modeling of gettering of precipitated impurities from si for carrier lifetime improvement in solar cell applications, J. Appl. Phys. 86 (1999) 2453-2458.
DOI: 10.1063/1.371075
Google Scholar
[43]
D. P. Fenning, High temperature defect engineering for silicon solar cells: Predictive process simulation and synchrotron-based microcharacterization, Ph.D. thesis, Massachusetts Institute of Technology (2013).
Google Scholar
[44]
I. E. Reis, S. Riepe, W. Koch, J. Bauer, S. Beljakowa, O. Breitenstein, H. Habenicht, D. Kresner-Kiel, G. Pensl, J. Schon, W. Seifert, Effect of impurities on solar cell parameters in intentionally contaminated multicrystalline silicon, in: proc. 24th EUPVSEC, Hamburg, Germany, 2009, pp.2144-2148.
Google Scholar
[45]
B. Michl, J. Schon, W. Warta, M. C. Schubert, The impact of different diffusion temperature profiles on iron concentrations and carrier lifetimes in multicrystalline silicon wafers, IEEE J. Photovoltaics 3 (2012) 635 - 640.
DOI: 10.1109/jphotov.2012.2231726
Google Scholar
[46]
D. Macdonald, S. Phang, F. Rougieux, S. Lim, D. Paterson, D. Howard, M. D. de Jonge, C. Ryan, Ironrich particles in heavily contaminated multicrystalline silicon wafers and their response to phosphorus gettering, Semiconductor Science and Technology 27 (12) (2012).
DOI: 10.1088/0268-1242/27/12/125016
Google Scholar
[47]
A. E. Morishige, D. P. Fenning, J. Hofstetter, D. M. Powell, T. Buonassisi, Enhanced phosphorus diffusion gettering by temperature optimization, in: 38th IEEE PVSC, Austin, TX, (2012).
DOI: 10.1109/pvsc.2012.6318036
Google Scholar
[48]
A. E. Morishige, Master's thesis (unpublished).
Google Scholar
[49]
C. Donolato, Modeling the effect of dislocations on the minority carrier diffusion length of a semiconductor, J. Appl. Phys. 84 (5) (1998) 2656-2664.
DOI: 10.1063/1.368378
Google Scholar
[50]
G. Stokkan, S. Riepe, O. Lohne, W. Warta, Spatially resolved modeling of the combined effect of dislocations and grain boundaries on minority carrier lifetime in multicrystalline silicon, J. Appl. Phys. 101 (5) (2007) 053515.
DOI: 10.1063/1.2435815
Google Scholar
[51]
M. Rinio, S. Peters, M. Werner, A. Lawerenz, H. Muller, Measurement of the normalized recombination strength of dislocations in multicrystalline silicon solar cells, in: Solid State Phenomena 82 - 84, 2002, pp.701-706.
DOI: 10.4028/www.scientific.net/ssp.82-84.701
Google Scholar
[52]
M. I. Bertoni, D. P. Fenning, M. Rinio, V. Rose, M. Holt, J. Maser, T. Buonassisi, Nanoprobe X-ray fluorescence characterization of defects in large-area solar cells, Energy & Environmental Science 4 (10) (2011) 4252-4257.
DOI: 10.1039/c1ee02083h
Google Scholar
[53]
J. Hofstetter, D. P. Fenning, D. B. Needleman, D. M. Powell, A. E. Morishige, S. Castellanos, T. Buonassisi, Correlation of the interstitial iron concentration and the recombination strength of dislocations in multicrystalline silicon, in: visual presentation at SiliconPV 2013, Hameln, Germany, (2013).
Google Scholar
[54]
C. Reimann, G. Müller, J. Friedrich, K. Lauer, A. Simonis, H. Wätzig, S. Krehan, R. Hartmann, A. Kruse, Systematic characterization of multi-crystalline silicon string ribbon wafer, Journal of Crystal Growth 361 (2012) 38 - 43.
DOI: 10.1016/j.jcrysgro.2012.08.022
Google Scholar
[55]
D. P. Fenning, A. S. Zuschlag, A. Frey, J. Hofstetter, M. I. Bertoni, G. Hahn, T. Buonassisi, Investigation of lifetime-limiting defects after high-temperature phosphorus diffusion in silicon solar cell materials, IEEE J. Photovoltaics (2013).
DOI: 10.1109/jphotov.2014.2312485
Google Scholar
[56]
M. Seibt, R. Khalil, V. Kveder, W. Schroter, Electronic states at dislocations and metal silicide precipitates in crystalline silicon and their role in solar cell materials, Appl. Phys. A 96 (2009) 235-253.
DOI: 10.1007/s00339-008-5027-8
Google Scholar
[57]
H. J. Choi, M. I. Bertoni, J. Hofstetter, D. P. Fenning, D. M. Powell, S. Castellanos, T. Buonassisi, Dislocation density reduction during impurity gettering in multicrystalline silicon, IEEE J. Photovoltaics 3 (2012) 189 - 198.
DOI: 10.1109/jphotov.2012.2219851
Google Scholar