Identifitcation of Bandgap States in Semiconductors by Transmutation of Implanted Radioactive Tracers
p.113
p.113
Hall Effect Measurements on Transmutation Doped Semiconductors
p.119
p.119
Characterization of Cu/Al2O3 Interfaces after Heavy Ion Irradiation
p.125
p.125
In-Depth Characterization of Damage Produced by Swift Heavy Ion Irradiation Using a Tapping Mode Atomic Force Microscope
p.129
p.129
Hardness Enhancement and Crosslinking Mechanisms in Polystyrene Irradiated with High Energy Ion-Beams
p.135
p.135
Diffusion Studies in Polymers Using MeV Ion Beams
p.147
p.147
Ion Induced Passivation of Metal Surfaces: The Phenomenon and its Origins
p.155
p.155
Flux Pinning by Columnar Defects in Bi2Sr2CaCu2O8-Thin Films
p.159
p.159
Depth Resolved Oxygen Analysis at the Interfaces of Au-Al Layers
p.163
p.163
Hardness Enhancement and Crosslinking Mechanisms in Polystyrene Irradiated with High Energy Ion-Beams
Abstract:
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Periodical:
Materials Science Forum (Volumes 248-249)
Pages:
135-146
Citation:
Online since:
May 1997
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