Is Low Frequency Excess Noise of GMI Induced by Magnetization Fluctuations?

Christophe Dolabdjian; Basile Dufay; Sebastien Saez; Arthur Yelon; David Ménard

doi:10.4028/www.scientific.net/KEM.605.437

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HomeKey Engineering MaterialsKey Engineering Materials Vol. 605Is Low Frequency Excess Noise of GMI Induced by...

Is Low Frequency Excess Noise of GMI Induced by Magnetization Fluctuations?

Abstract:

We have investigated the possible impact of low frequency magnetization fluctuations on the equivalent magnetic excess noise of GMI sensors, which we have recently shown to exhibit 1/f noise. This noise component is not associated with the detailed measuring setup nor with the conditioning electronic noise sources, suggesting that it is intrinsic to the sensing element. Various intrinsic GMI noise sources might be able to explain this observation; these include magnetic domain wall motion, hysteresis loop losses, etc. Since GMI elements are excited by a high frequency current, it has been assumed that these low frequency (lf) intrinsic noise sources cannot interact with the carrier and the sensed signal. We recall that the GMI effect is based on an impedance variation, which is governed by magnetization angle variations. These are modulated by the sensed signal and the lf magnetization noise, which then appear as sidebands around the carrier frequency. Applying the fluctuation-dissipation theorem to the GMI model, we have related both the signal and noise to the magnetic susceptibility spectrum and thus quantified the equivalent magnetic noise of GMI sensors at lf. We then present a preliminary comparison to our previous experimental results.

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Periodical:

Key Engineering Materials (Volume 605)

Pages:

437-440

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.605.437

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Online since:

April 2014

Authors:

Christophe Dolabdjian, Basile Dufay, Sebastien Saez, Arthur Yelon, David Ménard

Keywords:

GMI, Magnetization Fluctuations, Magnetometers, Noise

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