Design and Implementation of a S-Parameter Wafer Defect Scanner
p.501
p.501
HV Design of a Pulsed Lifetime Beam with a Grounded Sample
p.504
p.504
Long Term Performance of the Reactor Based Positron Beam POSH
p.507
p.507
Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe
p.510
p.510
The Slow Positron Beam Based on Beijing Electron-Positron Collider
p.513
p.513
A High-Resolution BaF2 Positron Lifetime Spectrometer with High Counting Rate
p.516
p.516
Condensed Matter and Defect-Related Research at ICPA-13
p.519
p.519
ICPA-13 Summary Talk: Chemistry and Polymers
p.523
p.523
Positron Atomic Physics and Instrumentation: a Summary
p.527
p.527
ICPA-13 Summary Talk: Chemistry and Polymers
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 445-446)
Pages:
523-526
Citation:
Online since:
January 2004
Authors:
Keywords:
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