Localisation of Deformation and Internal Residual Stresses in Billets for Zr-Nb Pipe Rolling
p.647
p.647
Measurement of Residual Stress Through a Shot Peened Surface Subjected to Successive Material Removal
p.653
p.653
Round Robin Test on the Determination of Residual Stress Depth Distributions by X-ray Diffraction
p.659
p.659
Behavior of Metallic Samples Subjected to External Stresses during Heating-Cooling Cycles
p.665
p.665
Yield Strength Determination of TiN Film by In-Situ XRD Stress Analysis Method
p.671
p.671
X-Ray Stress Measurements of TiCN Thin Films
p.677
p.677
Residual Stresses in Decorative Electroplated Coatings
p.683
p.683
Changes in Stress and Microstructure in Sputter Deposited Copper Films Due to Substrate Surface Effects
p.691
p.691
Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction
p.697
p.697
Yield Strength Determination of TiN Film by In-Situ XRD Stress Analysis Method
Abstract:
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Info:
Periodical:
Materials Science Forum (Volumes 404-407)
Pages:
671-676
Citation:
Online since:
August 2002
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Keywords:
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