Growth, Structure and Interfaces of Cu and Cu/Ti Thin Films on (0001) α-Al2O3
p.217
p.217
A Candidate for Grain Boundary Pipe Diffusion and Intrinsic Electrical Activity in Silicon
p.221
p.221
Atomistic Simulation of Grain Boundaries in Alumina
p.225
p.225
Grain Boundary Structure in Ni3Al
p.229
p.229
Epitaxy of Deposited α-Fe Films on High-Index Cu Substrate Planes
p.233
p.233
Interfaces in SiC/C CVD Multilayers
p.237
p.237
Atomic Structure of the Interface between Epitaxial Niobium Films and α-Al2O3 Substrates
p.241
p.241
Determination of the Atomistic Structure of the ∑3 (111) Twin Boundary in NiAl
p.245
p.245
Direct Free Energy Estimates along a Real Path by Means of Constrained Molecular Dynamics
p.249
p.249
Epitaxy of Deposited α-Fe Films on High-Index Cu Substrate Planes
Abstract:
You might also be interested in these eBooks
Info:
Periodical:
Materials Science Forum (Volumes 207-209)
Pages:
233-236
Citation:
Online since:
February 1996
Authors:
Keywords:
Price:
Permissions: