Preparation of Mg and Ti Co-Doped NiO-Based Ceramic and its High Dielectric Properties

Bo Cheng; Yuan Hua Lin; Jing Nan Cai; Ce Wen Nan

doi:10.4028/www.scientific.net/KEM.368-372.37

Paper Titles

Preparation and Characterization of Relaxor-Based Ferroelectric Thick Films with Single Perovskite Structure
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Fabrication of Spark Plasma Sintering on Pb(Mg_1/3Nb_2/3)O₃–PbTiO₃ Ceramics Layers Prepared by Tape Casting and TGG Method
p.27

Preparation and Characterization of Perovskite Pb(Mg_1/3Nb_2/3)O₃-PbTiO₃ by a Modified Polymerized Complex Process
p.30

Characterization of the Bismuth-Based Piezoelectric Ceramic System (1-x)Bi(Mg_1/2Zr_1/2)O₃-xPbTiO₃
p.33

Preparation of Mg and Ti Co-Doped NiO-Based Ceramic and its High Dielectric Properties
p.37

Liquid Phase Sintering of Barium Titanate Ceramics for High Energy Density Capacitors
p.40

Effects of Processing on Microstructure and Dielectric Properties of Ultrafine- Grained Barium Titanate Based Ceramics for BME-MLCC Applications
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Synthesis, Characterization and Electrical Properties of Barium Titanate Films Fabricated by Hydrothermal Method
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Preparation of Barium Strontium Titanate Nanopowders by a Sol-Gel Hydrothermal Synthesis Method
p.50

HomeKey Engineering MaterialsKey Engineering Materials Vols. 368-372Preparation of Mg and Ti Co-Doped NiO-Based...

Preparation of Mg and Ti Co-Doped NiO-Based Ceramic and its High Dielectric Properties

Abstract:

We present Mg and Ti co-doped NiO-based polycrystalline ceramic with high-permittivity dielectric properties. Analysis of the ceramic’s microstructure and composition proves that obvious grain boundaries NiTiO3 are formed. The measurements of frequency and temperature dependence of impedance and dielectric permittivity indicate that the grain and grain boundaries have remarkable influence on the dielectric properties due to the various activation energies.

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Periodical:

Key Engineering Materials (Volumes 368-372)

Pages:

37-39

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.368-372.37

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Online since:

February 2008

Authors:

Bo Cheng, Yuan Hua Lin, Jing Nan Cai, Ce Wen Nan

Keywords:

Dielectric, Grain Boundary, Mg-Ti-Ni-O

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