Three-Dimensional Emitter Based on Locally Enhanced Diffusion (TREBLE) Structure: Modeling and Formation
p.713
p.713
Effective Gettering Mechanisms in Solar Multicrystalline Materials
p.719
p.719
Strain Characterisation at the nm Scale of Deep Sub-Micron Devices by Convergent-Beam Electron Diffraction
p.727
p.727
Gate-Oxide Integrity Evaluation Using Non-Ideal Metal-Oxide-Silicon Capacitor Structures
p.735
p.735
Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization
p.741
p.741
Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si
p.747
p.747
A Technique for Delineating Defects in Silicon
p.753
p.753
SEM Vision Periodic Defect Review and Characterization after Inter-Metal Dielectric Deposition
p.759
p.759
Ellipsometric Study of Ion-Implantation Damage in Single-Crystal Silicon - An Advanced Optical Model
p.765
p.765
Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization
Abstract:
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Info:
Periodical:
Solid State Phenomena (Volumes 82-84)
Pages:
741-746
Citation:
Online since:
November 2001
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