Standard Reference Materials for the Measurement of Instrument Resolution Functions: Effect of Transparency
p.278
p.278
Toward EXPO: From the Powder Pattern to the Crystal Structure
p.284
p.284
Solving Crystal Structures from Powder Data: The Use of a Molecular Fragment
p.289
p.289
Crystal Structure Determination from Powder Diffraction Data by the Application of a Genetic Algorithm
p.294
p.294
Rietveld Analysis of Disordered Layer Silicates
p.300
p.300
ZONE - A Program for Analysis of Brillouin Zone Configuration
p.306
p.306
The Use of Brilliance in Powder Diffraction: Towards High Resolution Kinetic Studies
p.312
p.312
Development of Curved Image-Plate Techniques for Studies of Powder Diffraction, Liquids and Amorphous Materials
p.318
p.318
High Resolution Synchrotron Strain Scanning at BM16 at the ESRF
p.323
p.323
Rietveld Analysis of Disordered Layer Silicates
Abstract:
You might also be interested in these eBooks
Info:
Periodical:
Materials Science Forum (Volumes 278-281)
Pages:
300-305
Citation:
Online since:
April 1998
Authors:
Keywords:
Price:
Permissions: