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A nondestructive material characterization technique for obtaining the permittivity and permeability of conductor-backed media using a conformable broadband microstrip probe is detailed. The material properties are extracted via comparison of theoretical and measured scattering parameters using an iterative solver. Expressions for the theoretical scattering parameters are obtained via an EFIE formulation and a network analyzer is utilized to acquire the measured scattering parameters. Advantages of the flexible microstrip probe are discussed and experimental results for sample materials are provided and compared to stripline and waveguide measurements in order to validate the analysis.
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