Abstract
We investigate the cross section of transmitted X-ray beam diffracted by reflecting atomic planes (10–11) of a SiO2 single crystal in Laue geometry for different values of temperature gradient applied to the crystal. It is shown that the angular width of a fully pumped X-ray beam depends on the distance between the source and the studied sample and decreases with the increase in this distance.
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Original Russian Text © K.T. Hayrapetyan, S.N. Noreyan, V.V. Margaryan, 2010, published in Izvestiya NAN Armenii, Fizika, 2010, Vol. 45, No. 3, pp. 215–220.
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Hayrapetyan, K.T., Noreyan, S.N. & Margaryan, V.V. Study of angular width of an X-ray beam fully pumped from quartz single crystal in the presence of temperature gradient. J. Contemp. Phys. 45, 140–144 (2010). https://doi.org/10.3103/S1068337210030084
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DOI: https://doi.org/10.3103/S1068337210030084