Abstract
An electrical method of indirect measurement of the cross sectional area of a conductor covered by a dielectric covering at casting in a suspended state is considered. The description of the method, the structural and electric equivalent schemes, and a mathematical treatment describing the essence and correctness of the method, as well as an error analysis of the method and its permissible possibilities, are given. Conditions under which the error of the measurement of the cross sectional area is the least are given.
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Ulitovskii, A.V. and Averin, N.M., USSR Inventor’s Certificate no. 8596, Byull. Izobret., 1948.
Dimitraki, S.N., Methods and Devices for Measurement and Simulation of Microconductor Parameters and Microconductor Articles in the Production Process, Doct. Sci. (Tech.) Dissertation, Moldova Tech. Univ., 1986.
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Original Russian Text © N.S. Dimitraki, S.N. Dimitraki, 2008, published in Elektronnaya Obrabotka Materialov, 2008, No. 1, pp. 81–85.
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Dimitraki, N.S., Dimitraki, S.N. Measurement of a conductor cross sectional area. Surf. Engin. Appl.Electrochem. 44, 69–72 (2008). https://doi.org/10.3103/S1068375508010146
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DOI: https://doi.org/10.3103/S1068375508010146