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High-time resolution radiographic technique for studying nanostructures with the use of synchrotron radiation

  • Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2007”
  • Published:
Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

A high-time resolution radiographic technique for studying nanostructures using synchrotron radiation is described. A new modification of the methods, which makes it possible to perform large-scale X-ray diffraction analysis of structures of organic crystals, is proposed. X-ray diffraction patterns obtained in test experiments on a number of biological samples are presented.

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Correspondence to V. N. Korneev.

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Original Russian Text © V.N. Korneev, V.A. Shlektarev, V.M. Aul’chenko, M.R. Sharafutdinov, V.P. Tolochko, A.V. Zabelin, O.V. Naida, A.A. Vazina, 2008, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2008, Vol. 72, No. 2, pp. 214–217.

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Korneev, V.N., Shlektarev, V.A., Aul’chenko, V.M. et al. High-time resolution radiographic technique for studying nanostructures with the use of synchrotron radiation. Bull. Russ. Acad. Sci. Phys. 72, 197–200 (2008). https://doi.org/10.3103/S1062873808020159

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  • DOI: https://doi.org/10.3103/S1062873808020159

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