Abstract
“Transrotational” Se and α-Fe2O3 spherulites have been investigated by transmission electron microscopy and atomic force microscopy. Combination of these two microscopic methods made it possible to reveal structural peculiarities and the character of the spherulite surface, as well as to compare these data. It is established that, along with the regularly changing lattice orientation at the crystallization front, there is a regular relief of the crystal surface. Inheritance of the globular structure of the amorphous matrix by a growing crystal is revealed. In this case, the structure remains homogeneous, independent of the differences in the lattice orientation and imperfection of the regions crystallized.
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Original Russian Text © V.Yu. Kolosov, K.L. Shvamm, R.V. Gainutdinov, A.L. Tolstikhina, 2007, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2007, Vol. 71, No. 10, pp. 1481–1485.
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Kolosov, V.Y., Shvamm, K.L., Gainutdinov, R.V. et al. Combined TEM-AFM study of “transrotational” spherulites growing in thin amorphous films. Bull. Russ. Acad. Sci. Phys. 71, 1442–1446 (2007). https://doi.org/10.3103/S1062873807100280
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DOI: https://doi.org/10.3103/S1062873807100280