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Selection of the number of redundant thyristors for a powered semiconductor phase shifter in accordance with the results of predicting reliability rates

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Abstract

A method to calculate the reliability rates of semiconductor thyristor switch arrays in the structure of a high-powered phase shifter in power engineering is considered. Comparison of reliability rates using different numbers of redundant thyristors is carried out. Based on reliability prediction and overvoltage estimation in marginally controlled and uncontrolled operation modes, an optimal number of redundant thyristors for high power switches is chosen.

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References

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Authors
  1. M. A. Novikov
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  2. P. A. Rashitov
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  3. T. V. Remizevich
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  4. M. I. Fedorova
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Additional information

Original Russian Text © M.A. Novikov, P.A. Rashitov, T.V. Remizevich, M.I. Fedorova, 2013, published in Elektrotekhnika, 2013, No. 12, pp. 29–35.

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Novikov, M.A., Rashitov, P.A., Remizevich, T.V. et al. Selection of the number of redundant thyristors for a powered semiconductor phase shifter in accordance with the results of predicting reliability rates. Russ. Electr. Engin. 84, 684–690 (2013). https://doi.org/10.3103/S1068371213120122

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  • DOI: https://doi.org/10.3103/S1068371213120122

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