1987 年 36 巻 407 号 p. 823-829
Recently, a synchrotron radiation source (SR) has become available as an excellent X-ray source. X-rays from SR (XSR) have following features: (1) high intensity, (2) optional wavelength with narrow width is obtained when monochromater is used, and (3) small divergency. These provide the accurate stress measurements on many (hkl) planes in the higher Bragg angle region since the X-rays with optional wavelength can be selected. Such features of SR are most suitable for the stress analysis for materials having preferred orientations.
In this study, the stress in cold rolled steel specimens having the preferred orientation was measured by X-rays from the synchrotron radiation source. The results obtained are summarized as follows:
(1) The diffractions from (211), (220) and (321) planes were obtained separately with high accuracy in a short time.
(2) The stress in the textured steels was evaluated by an analytical method utilizing more than one diffraction plane belonging to one zone axis. This was found to be a suitable method for the stress analysis by use of XSR because the stresses in various lattice planes can be obtained with the same accuracy.
(3) The X-ray elastic constant measured experimentally agreed well with the analytical value calculated from single crystal compliances.