A high temperature energy dispersive X-ray diffraction (EDXD) facility has been newly built using a vertical type goniometer, which make it possible to measure the diffraction profiles of melts from room temperature to 1873 K. The fundamentals of this facility were confirmed by obtaining the interference function of a silica glass sample over Q=200 nm⁻¹ at room temperature using the computer program of PEDX for the generalized radial distribution function analysis of EDXD developed by the present authors (Petkov and Waseda). The feasibility for a high temperature melt was made by applying this EDXD facility to a structural study of liquid bismuth germanate (Bi₄Ge₃O₁₂) at 1373 K.