Novel Applications of Scanning Ultrafast Electron Microscopy (SUEM)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
The Scanning Ultrafast Electron Microscope (SUEM) was used to image a wide array samples using a variety of standard and non-standard operating conditions on a custom system built in Org. 8942. The ability of this technique to produce high-quality images was assessed during this one year LDRD. To obtain details about the devices imaged, as well as the experimental details, please refer to the classified report from the project manager, Rich Dondero, or the NSP IA lead, Kristina Czuchlewski.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program
- DOE Contract Number:
- AC04-94AL85000; NA0003525
- OSTI ID:
- 1564040
- Report Number(s):
- SAND-2019-10952; 679441
- Country of Publication:
- United States
- Language:
- English
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