Ptychograhy is a scanning coherent diffraction imaging technique capable of providing images of extended samples with diffraction-limited resolution. However, ptychography experiments are time-consuming due to their scanning nature which also prevents their use for imaging of dynamical processes. Recently, setups based on two con-focal lenses were proposed to perform single-shot ptychography in the visible regime by measuring the diffraction pattern produced by multiple overlapping beams in one shot. However, this approach cannot be extended straightforwardly to X-ray wavelengths due to the application of refractive optics. In this work, we demonstrate a novel and nascent single-shot ptychography setup utilizing the combination of X-ray focusing optics with a two-dimensional beam-splitting diffraction grating. It allows single-shot imaging of extended samples at X-ray wavelengths. As a proof of concept, we performed single-shot ptychography in the XUV range at the free-electron laser FLASH and obtained a high-resolution reconstruction of the sample.