Abstract
The analytical sensitivities of elements were improved by Ar-N2 inductively coupled plasma (Ar-N2 ICP) in axially viewing optical emission spectrometry (OES). A commercially available ICP-OES instrument was used, and only N2 gas was added at flow rates of up to 1.0 L min−1 into Ar plasma gas. A stable Ar-N2 ICP was obtained, and the net signal intensities of elements were enhanced by factors of up to 25 compared to those observed for Ar ICP-OES. The detection limits evaluated were also improved by factors from 5 to 10, especially for elements with relatively higher ionization energies. Moreover, the analytical sensitivities for these elements observed in axially viewing Ar-N2 ICP-OES were superior to those in radially viewing Ar-N2 ICP-OES reported previously. The Ar-N2 ICP is expected to be a useful alternative source for excitation and ionization in axially viewing ICP-OES.
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Ohata, M., Takaku, Y., Inagaki, K. et al. Improvement of Analytical Sensitivity by Ar-N2 Inductively Coupled Plasma in Axially Viewing Optical Emission Spectrometry. ANAL. SCI. 25, 161–163 (2009). https://doi.org/10.2116/analsci.25.161
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DOI: https://doi.org/10.2116/analsci.25.161