Eccentric Connectivity Index of Nanosheets and Nanotube of SiO<sub>2</sub>

A. Berin Greeni; S. Jancy

doi:10.20965/jaciii.2023.p0649

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JACIII Vol.27 No.4 pp. 649-654

doi: 10.20965/jaciii.2023.p0649

(2023)

Research Paper:

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Eccentric Connectivity Index of Nanosheets and Nanotube of SiO₂

A. Berin Greeni and S. Jancy

School of Advanced Sciences, Vellore Institute of Technology
Vandalur-Kelambakkam Road, Chennai, Tamil Nadu 600127, India

Received:

July 16, 2022

Accepted:

March 28, 2023

Published:

July 20, 2023

Keywords:

eccentric connectivity index, nanosheets, nanotubes

Abstract

Chemical graph theory is a field related to Chemistry which is used to predict the behavior of chemical structures. The current trend in Chemical graph theory is evaluating topological indices. They are the numerical descriptors of the molecular structures derived from their corresponding molecular graph. These indices are studied and used in drugs, pharmaceutical research, and other fields. In this paper, the eccentric connectivity index is computed for nanosheets and nanotubes of SiO₂.

Cite this article as:

A. Greeni and S. Jancy, “Eccentric Connectivity Index of Nanosheets and Nanotube of SiO₂,” J. Adv. Comput. Intell. Intell. Inform., Vol.27 No.4, pp. 649-654, 2023.

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References

[1] V. Sharma, R. Goswami, and A. K. Madan, “Eccentric connectivity index: A novel highly discriminating topological descriptor for structure–property and structure–activity studies,” J. of Chemical Information and Computer Sciences, Vol.37, No.2, pp. 273-282, 1997. https://doi.org/10.1021/ci960049h
[2] X. Zhang, M. K. Siddiqui, M. Naeem, and A. Q. Baig, “Computing Eccentricity Based Topological Indices of Octagonal Grid O_n^m,” Mathematics, Vol.6, No.9, Article No.153, 2018. https://doi.org/10.3390/math6090153
[3] H. Shaker, M. Imran, and W. Sajjad, “Eccentricity based topological indices of face centered cubic lattice FCC(n),” Main Group Metal Chemistry, Vol.44, No.1, pp. 32-38, 2016. https://doi.org/10.1515/mgmc-2021-0005
[4] M. Arockiaraj, S. Klavžar, S. Mushtaq, and K. Balasubramanian, “Distance-based topological indices of nanosheets, nanotubes and nanotori of SiO₂,” J. of Mathematical Chemistry, Vol.57, No.1, pp. 343-369, 2019. https://doi.org/10.1007/s10910-018-0956-8
[5] F. Farrukh, Sabeel-e-Hafi, R. Farooq, and M. R. Farahani, “Calculating Some Topological Indices of SiO₂ Layer Structure,” J. of Informatics and Mathematical Sciences, Vol.8, No.3, pp. 181-187, 2016.
[6] S. Akhter, M. Imran, and Z. Iqbal, “Mostar indices of SiO₂ nanostructures and melem chain nanostructures,” Int. J. of Quantum Chemistry, Vol.121, No.5, Article No.e26520, 2020. https://doi.org/10.1002/qua.26520
[7] P. J. N. Thayamathy, P. Elango, and M. Koneswaran, “M-Polynomial and Degree Based Topological Indices for Silicon Oxide,” Int. Research J. of Pure and Applied Chemistry, Vol.16, No.4, pp. 1-9, 2018. https://doi.org/10.9734/IRJPAC/2018/42645

This article is published under a Creative Commons Attribution-NoDerivatives 4.0 Internationa License.

[1] [1] V. Sharma, R. Goswami, and A. K. Madan, “Eccentric connectivity index: A novel highly discriminating topological descriptor for structure–property and structure–activity studies,” J. of Chemical Information and Computer Sciences, Vol.37, No.2, pp. 273-282, 1997. https://doi.org/10.1021/ci960049h

[2] [2] X. Zhang, M. K. Siddiqui, M. Naeem, and A. Q. Baig, “Computing Eccentricity Based Topological Indices of Octagonal Grid O_n^m,” Mathematics, Vol.6, No.9, Article No.153, 2018. https://doi.org/10.3390/math6090153

[3] [3] H. Shaker, M. Imran, and W. Sajjad, “Eccentricity based topological indices of face centered cubic lattice FCC(n),” Main Group Metal Chemistry, Vol.44, No.1, pp. 32-38, 2016. https://doi.org/10.1515/mgmc-2021-0005

[4] [4] M. Arockiaraj, S. Klavžar, S. Mushtaq, and K. Balasubramanian, “Distance-based topological indices of nanosheets, nanotubes and nanotori of SiO₂,” J. of Mathematical Chemistry, Vol.57, No.1, pp. 343-369, 2019. https://doi.org/10.1007/s10910-018-0956-8

[5] [5] F. Farrukh, Sabeel-e-Hafi, R. Farooq, and M. R. Farahani, “Calculating Some Topological Indices of SiO₂ Layer Structure,” J. of Informatics and Mathematical Sciences, Vol.8, No.3, pp. 181-187, 2016.

[6] [6] S. Akhter, M. Imran, and Z. Iqbal, “Mostar indices of SiO₂ nanostructures and melem chain nanostructures,” Int. J. of Quantum Chemistry, Vol.121, No.5, Article No.e26520, 2020. https://doi.org/10.1002/qua.26520

[7] [7] P. J. N. Thayamathy, P. Elango, and M. Koneswaran, “M-Polynomial and Degree Based Topological Indices for Silicon Oxide,” Int. Research J. of Pure and Applied Chemistry, Vol.16, No.4, pp. 1-9, 2018. https://doi.org/10.9734/IRJPAC/2018/42645

Eccentric Connectivity Index of Nanosheets and Nanotube of SiO2

A. Berin Greeni and S. Jancy

Eccentric Connectivity Index of Nanosheets and Nanotube of SiO₂