Title |
Precise Bunch Charge Measurement Using BPM Pickup |
Authors |
- J. Chen, S.S. Cao, F.Z. Chen, B. Gao, L.W. Lai, Y.B. Leng, T. Wu, X.Y. Xu, R.X. Yuan, Y.M. Zhou
SSRF, Shanghai, People’s Republic of China
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Abstract |
Precise bunch charge measurement is the fundamental of charge feedback, beam lifetime measurement, beam loss monitor, as well as the basis of the related interlocking work. Beam position monitor (BPM) is often used for high-precision bunch charge measurement due to its superior performance. In this paper, the pros and cons of different types of BPM for measurement of bunch charge in storage ring and free electron laser (FEL) will be discussed. The related simulations, beam experiment and signal processing methods are also mentioned. The beam experiments results show that the relative bunch charge resolution of the Button BPM can reach 0.02% in SSRF, 0.073% and 0.021% of the SBPM and CBPM in SXFEL, respectively. Besides, based on the method of beam experiments, we systematically studied the position dependence of BPM pickup and related compensation algorithms for high-precision bunch charge measurement.
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Paper |
download TUAO01.PDF [1.518 MB / 5 pages] |
Slides |
download TUAO01_TALK.PDF [7.299 MB] |
Export |
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Conference |
IBIC2020 |
Series |
International Beam Instrumentation Conference (9th) |
Location |
Santos, Brazil |
Date |
14-18 September 2020 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Daniel Tavares (LNLS, Campinas, Brazil); Renan Picoreti (LNLS, Campinas, Brazil); Gustavo Bruno (LNLS, Campinas, Brazil); Sergio Marques (LNLS, Campinas, Brazil); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
Online ISBN |
978-3-95450-222-6 |
Online ISSN |
2673-5350 |
Received |
02 September 2020 |
Accepted |
17 September 2020 |
Issue Date |
30 October 2020 |
DOI |
doi:10.18429/JACoW-IBIC2020-TUAO01 |
Pages |
21-25 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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