| Title |
Sub-Femtosecond Time-Resolved Measurements Based on a Variable Polarization X-Band Transverse Deflecting Structures for SwissFEL |
| Authors |
- P. Craievich, M. Bopp, H.-H. Braun, R. Ganter, M. Pedrozzi, E. Pratpresenter, S. Reiche, R. Zennaro
PSI, Villigen PSI, Switzerland
- R.W. Aßmann, F. Christie, R.T.P. D'Arcy, B. Marchetti, D. Marx
DESY, Hamburg, Germany
- N. Catalán Lasheras, A. Grudiev, G. McMonagle, W. Wuensch
CERN, Geneva, Switzerland
|
| Abstract |
The SwissFEL project, under commissioning at the Paul Scherrer Institut (PSI), will produce FEL radiation for soft and hard X-rays with pulse durations ranging from a few to several tens of femtoseconds. A collaboration between DESY, PSI and CERN has been established with the aim of developing and building an advanced X-Band transverse deflector structure (TDS) with the new feature of providing variable polarization of the deflecting force. As this innovative CERN design requires very high manufacturing precision to guarantee highest azimuthal symmetry of the structure to avoid the deterioration of the polarization of the streaking field, the high-precision tuning-free assembly procedures developed at PSI for the SwissFEL C-band accelerating structures will be used for the manufacturing. Such a TDS will be installed downstream of the undulators of the soft X-ray beamline of SwissFEL and thanks to the variable polarization of the TDS, it will be possible to perform a complete characterization of the 6D phase-space. We summarize in this work the status of the project and its main technical parameters.
|
| Paper |
download WEP040.PDF [0.542 MB / 4 pages] |
| Export |
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| Conference |
FEL2017, Santa Fe, NM, USA |
| Series |
International Free Electron Laser Conference (38th) |
| Proceedings |
Link to full FEL2017 Proccedings |
| Session |
Poster III |
| Date |
23-Aug-17 15:30–17:30 |
| Main Classification |
Electron Diagnostics, Timing, Controls |
| Keywords |
ion, FEL, undulator, diagnostics, polarization |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Kip Bishofberger (LANL, Los Alamos, NM, USA); Bruce Carlsten (LANL, Los Alamos, NM, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-179-3 |
| Published |
February 2018 |
| Copyright |
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