Title |
Tests of the Extended Range SRF Cavity Tuners for the LCLS-II HE Project |
Authors |
- C. Contreras-Martinez, T.T. Arkan, A.T. Cravatta, B.D. Hartsell, J.A. Kaluzny, T.N. Khabiboulline, Y.M. Pischalnikov, S. Posen, G.V. Romanov, J.C. Yun
Fermilab, Batavia, Illinois, USA
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Abstract |
The LCLS-II HE superconducting linac will produce multi-energy beams by supporting multiple undulator lines simultaneously. This could be achieved by using the cavity SRF tuner in the off-frequency detune mode. This off-frequency operation method was tested in the verification cryomodule (vCM) and CM 1 at Fermilab at 2 K. In both cases, the tuners achieved a frequency shift of -565±80 kHz. This study will discuss cavity frequency during each step as it is being assembled in the cryomodule string and finally when it is being tested at 2 K. Tracking the cavity frequency helped enable the tuners to reach this large frequency shift. The specific procedures of tuner setting during assembly will be presented.
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Paper |
download MOPA23.PDF [0.427 MB / 3 pages] |
Poster |
download MOPA23_POSTER.PDF [0.685 MB] |
Cite |
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Conference |
NAPAC2022 |
Series |
International Particle Accelerator Conference (5th) |
Location |
Albuquerque, NM, USA |
Date |
07-12 August 2022 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Sandra Biedron (Element Aero, Chicago, IL, USA); Evgenya Simakov (LANL, Los Alamos, NM, USA); Stephen Milton (Element Aero, Chicago, IL, USA); Petr M. Anisimov (LANL, Los Alamos, NM, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
Online ISBN |
978-3-95450-232-5 |
Online ISSN |
2673-7000 |
Received |
03 August 2022 |
Revised |
11 August 2022 |
Accepted |
19 August 2022 |
Issue Date |
31 August 2022 |
DOI |
doi:10.18429/JACoW-NAPAC2022-MOPA23 |
Pages |
100-102 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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