| Title |
Beam Lifetime Measurements in Sirius Storage Ring |
| Authors |
- M.B. Alves, L. Liu, X.R. Resende, F.H. de Sá
LNLS, Campinas, Brazil
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| Abstract |
SIRIUS is the new storage ring-based 4th generation synchrotron light source built and operated by the Brazilian Synchrotron Light Laboratory (LNLS) at the Brazilian Center for Research in Energy and Materials (CNPEM). In ultralow emittance storage rings such as SIRIUS, the dominant contribution to the beam lifetime is due to large angle scattering between electrons within the same bunch, namely the Touschek effect. We used the strategy of storing two bunches simultaneously with different currents to measure their Touschek lifetime independently of other contributions, such as gas scattering. The measurements were carried out in different conditions of bunch current and RF voltage to compare the experimental results with those expected from theory and simulations for SIRIUS.
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| Paper |
download WEPOTK055.PDF [0.430 MB / 4 pages] |
| Cite |
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| Conference |
IPAC2022 |
| Series |
International Particle Accelerator Conference (13th) |
| Location |
Bangkok, Thailand |
| Date |
12-17 June 2022 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Frank Zimmermann (CERN, Meyrin, Switzerland); Hitoshi Tanaka (RIKEN, Hyogo, Japan); Porntip Sudmuang (SRLI, Nakhon, Thailand); Prapong Klysubun (SRLI, Nakhon, Thailand); Prapaiwan Sunwong (SRLI, Nakhon, Thailand); Thakonwat Chanwattana (SRLI, Nakhon, Thailand); Christine Petit-Jean-Genaz (CERN, Meyrin, Switzerland); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| Online ISBN |
978-3-95450-227-1 |
| Online ISSN |
2673-5490 |
| Received |
08 June 2022 |
| Accepted |
15 June 2022 |
| Issue Date |
24 June 2022 |
| DOI |
doi:10.18429/JACoW-IPAC2022-WEPOTK055 |
| Pages |
2186-2189 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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