Title |
Goubau-Line Set Up for Bench Testing Impedance of In-Vacuum Undulator Components |
Authors |
- P.I. Volz, S. Grimmer, M. Huck, A. Meseck
HZB, Berlin, Germany
- A. Meseck
KPH, Mainz, Germany
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Abstract |
The worldwide first in-vacuum elliptical undulator, IVUE32, is being developed at Helmholtz Zentrum Berlin. The 2.5 m long device with a period length of 3.2 cm and a minimum gap of about 7 mm is to be installed in the BESSY II storage ring. It will deliver soft X-radiation to several beamlines. The proximity of the undulator structure to the electron beam makes the device susceptible to wakefield effects which can influence beam stability. A complete understanding of its impedance characteristics is required prior to installation and operation, as unforeseen heating of components could have catastrophic consequences. Since its complex structure makes numerical calculations, such as CST simulations, at high frequency very resource intensive, bench testing the device may proof invaluable. A Goubau-line is a single wire transmission line for high frequency surface waves with a transverse electric field resembling that of a charged particle beam out to a certain radial distance. This can be used to measure the impedance of vacuum chamber components. A concept optimized for bench testing IVUE32-components will be discussed and progress towards the test bench set up will be shown.
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Paper |
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Conference |
IPAC2021 |
Series |
International Particle Accelerator Conference (12th) |
Location |
Campinas, SP, Brazil |
Date |
24-28 May 2021 |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editorial Board |
Liu Lin (LNLS, Campinas, Brazil); John M. Byrd (ANL, Lemont, IL, USA); Regis Neuenschwander (LNLS, Campinas, Brazil); Renan Picoreti (LNLS, Campinas, Brazil); Volker R. W. Schaa (GSI, Darmstadt, Germany) |
Online ISBN |
978-3-95450-214-1 |
Online ISSN |
2673-5490 |
Received |
19 May 2021 |
Accepted |
23 July 2021 |
Issue Date |
21 August 2021 |
DOI |
doi:10.18429/JACoW-IPAC2021-THPAB057 |
Pages |
3883-3885 |
Copyright |
Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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