| Title |
Channeling Radiation Experiment at Fermilab ASTA |
| Authors |
- D. Mihalcea, P. Piot
Northern Illinois University, DeKalb, Illinois, USA
- D.R. Edstrom, P. Piot, T. Sen
Fermilab, Batavia, Illinois, USA
- W.D. Rushpresenter
KU, Lawrence, Kansas, USA
|
| Abstract |
Electron beams with moderate energy ranging from 4 to 50 MeV can be used to produce x-rays through the Channeling Radiation (CR) mechanism. Typically, the x-ray spectrum from these sources extends up to 140 keV and this range covers the demand for most practical applications. The parameters of the electron beam determine the spectral brilliance of the x-ray source. The electron beam produced at the Fermilab new facility Advanced Superconducting Test Accelerator (ASTA) meets the requirements to assemble an experimental high brilliance CR x-ray source. In the first stage of the experiment the energy of the beam is 20 MeV and due to the very low emittance (100 nm) at low bunch charge (20 pC) the expected average brilliance of the x-ray source is 0.8x10⁷ photons/[s-(mm-mrad)²-0.1%BW]. In the second stage of the experiment the beam energy will be increased to 50 MeV and consequently the average brilliance will be 4.8x10⁸ photons/[s-(mm-mrad)²-0.1%BW]. Also, the x-ray spectrum will be extended from about 30 keV to 140 keV.
|
| Paper |
download MOPWA009.PDF [0.457 MB / 4 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Monday Posters (Washington) |
| Date |
04-May-15 16:00–18:00 |
| Main Classification |
3: Alternative Particle Sources and Acceleration Techniques |
| Sub Classification |
A16 - Advanced Concepts |
| Keywords |
electron, photon, brilliance, experiment, detector |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
