| Title |
Nonequilibrium Phase Transitions in Crossed-Field Devices |
| Authors |
- S. Marini, R. Pakter, F.B. Rizzato
IF-UFRGS, Porto Alegre, Brazil
|
| Abstract |
This work presents a fully kinetic description to model the electron flow in the electronic crossed-field configuration observed in a smooth-bore magnetron. Through this model, it has been observed that, according to the electromagnetic field, the injection temperature and the charge density, the electron flow can be classified in two different stationary modes: magnetic insulation mode where most of the electrons returning to the cathode after a transient time and Child-Langmuir mode where most of the electrons reach the anode after a transient time. Focusing on magnetic insulated mode, it has been found that charge density and injection temperature define whether electrons are accelerated (accelerating regime) or decelerated (space-charge limited regime) on the cathode. Besides, when the injection temperature is relatively low (high), a small charge increase causes (does not cause) an abrupt transition between accelerating and space-charge limited regime. Basing on the results, it was possible to identify a critical temperature that separates abrupt and continuous behavior. The results have been verified by using self-consistent computer simulations*.
|
| Footnotes & References |
*S. Marini, F. B. Rizzato, and R. Pakter, Phys. Plasmas 21, 083111 (2014). |
| Funding |
This work was partially supported by CNPq and FAPERGS, Brazil, and by the US-AFOSR under the grant FA9550-09-1-0283. |
| Paper |
download MOPWA002.PDF [0.517 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Monday Posters (Washington) |
| Date |
04-May-15 16:00–18:00 |
| Main Classification |
5: Beam Dynamics and EM Fields |
| Sub Classification |
D11 - Code Developments and Simulation Techniques |
| Keywords |
electron, cathode, space-charge, simulation, injection |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
