Title |
Photoemission Electron Microscopy Branch of Spectromicroscopy Beamline of the Iranian Light Source Facility |
Authors |
- S. Amiri, H. Ghasempresenter, A. Gholampour, H. Khosroabadi, J. Rahighi
ILSF, Tehran, Iran
- H. Ghasempresenter, M. Lamehi Rashti
IPM, Tehran, Iran
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Abstract |
The Spectromicroscopy beamline is one of the day one beamlines of the Iranian Light Source Facility project in the field of soft x-ray spectroscopy. This beamline is designed to cover the 90-2500eV energy range with about 8000 resolving power, and the minimum spot size of about 10×4 micrometer 2 at sample position. Brilliance, flux and photon size and divergence in the whole range of energy has been calculated for a 4.3m linear undulator using SPECTRA code. This undulator has 10¹⁵ ph/s(0.1% B.W.) photon flux at 96 eV energy & 400 mA electron current. A circular pinhole with maximum diameter size of 2.52mm has been inserted in a distance of 10m from the source to pass 95% radiated. Primary layout of this branch includes a collimating mirror, a varied included-angle plane grating monochromator, and a KB bendable elliptical cylinder mirror. The ray tracing calculation by using computational software SHADOW has been done to determine and optimize of the important optical parameters. Three plane gratings with different uniform line density (700, 900, 1200 lines/mm) have been used to cover the whole energy range with the resolving power of 0.75-0.8×104 depending on the photon energy.
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Paper |
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Conference |
IPAC2014, Dresden, Germany |
Series |
International Particle Accelerator Conference (5th) |
Proceedings |
Link to full IPAC2014 Proccedings |
Session |
Poster Session, Ronaldo Area |
Date |
18-Jun-14 16:00–18:00 |
Main Classification |
02 Synchrotron Light Sources and FELs |
Sub Classification |
T26 Photon Beam Lines and Components |
Keywords |
undulator, electron, photon, focusing, brilliance |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editors |
Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Gianluigi Arduini (CERN, Geneva, Switzerland); Peter Michel (HZDR, Dresden, Germany); Volker RW Schaa (GSI, Darmstadt, Germany) |
ISBN |
978-3-95450-132-8 |
Published |
July 2014 |
Copyright |
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