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https://doi.org/10.18429/JACoW-IBIC2018-WEPB18
Title Performance of a Reflective Microscope Objective in an X-ray Pinhole Camera
Authors
  • L. Bobb, G. Rehm
    DLS, Oxfordshire, United Kingdom
Abstract X-ray pinhole cameras are used to measure the transverse beam profile of the electron beam in the storage ring from which the emittance is calculated. As improvements to the accelerator lattice reduce the beam emittance, e.g. with upgrades to fourth generation synchrotron light sources, likewise the beam size will be reduced such that micron and sub-micron scale resolution is required for beam size measurement. Therefore the spatial resolution of the pinhole camera imaging system must be improved accordingly. Here, the performance of a reflective microscope objective is compared to the high quality refractive lens which is currently in use to image the scintillator screen to the camera. The modulation transfer functions for each system have been assessed and will be discussed.
Paper download WEPB18.PDF [0.423 MB / 5 pages]
Poster download WEPB18_POSTER.PDF [0.751 MB]
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Conference IBIC2018
Series International Beam Instrumentation Conference (7th)
Location Shanghai, China
Date 09-13 September 2018
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Volker RW Schaa (GSI, Darmstadt, Germany)
Online ISBN 978-3-95450-201-1
Received 04 September 2018
Accepted 12 September 2018
Issue Date 29 January 2019
DOI doi:10.18429/JACoW-IBIC2018-WEPB18
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.