Erratum: Application of Atomic Force Microscopy in Formulation Engineering | Johnson Matthey Technology Review

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Volume 63, Issue 1

ISSN: 2056-5135

oa Erratum: Application of Atomic Force Microscopy in Formulation Engineering

A versatile tool for surface analysis
Authors: Lawrence Shere¹, Evangelos Liamas¹, Zhenyu Jason Zhang¹ and Jon A. Preece²
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Affiliations: ¹ School of Chemical Engineering, University of BirminghamEdgbaston, Birmingham, B15 2TTUK ² School of Chemistry, University of BirminghamEdgbaston, Birmingham, B15 2TTUK
Source: Johnson Matthey Technology Review, Volume 63, Issue 1, Jan 2019, p. 15 - 15
DOI: https://doi.org/10.1595/205651319X15423782543266
- Published online: 01 Jan 2019

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2019-01-01

2024-04-23

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References

Shere L., Zhang Z. J., and Preece J. A. Johnson Matthey Technol. Rev., 2018, 62, (4), 438 LINK https://doi.org/10.1595/205651318x15342609861275 [Google Scholar]

http://instance.metastore.ingenta.com/content/journals/10.1595/205651319X15423782543266

Article Type: Research Article

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