Rapid Communications
Development of a Frequency Comb Sweep Microwave Reflectometer in the Linear Device PANTA
2019 Volume 14 Pages 1201131
Details
2019 Volume 14 Pages 1201131
A frequency comb sweep microwave reflectometer is developed in PANTA to realize multi-point electron density measurements with high temporal resolution. A radial profile of the electron density is successfully reconstructed from simultaneous 17-point measurements with 2-µs temporal resolution. This result demonstrates the reliability and feasibility of the system for electron density profile diagnostics.
