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Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures

  • Nanoscale Characterization of Materials
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  1. Edward T. Yu
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Yu, E.T. Cross-Sectional Scanning Tunneling Microscopy of Semiconductor Heterostructures. MRS Bulletin 22, 22–26 (1997). https://doi.org/10.1557/S0883769400033765

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