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In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques

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Abstract

A scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the mechanical response of Au islands is studied by in situ indentation tests employing the AFM-tip and recording 2D X-ray diffraction patterns during mechanical loading.

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Acknowledgments

The authors gratefully acknowledge the financial support from the French National Research Agency through the project ANR-11-BS10-01401 MecaniX and the European Synchrotron Radiation Facility (ESRF) for the allocated experiment at the ID01 beamline. Furthermore, the authors acknowledge M. Cassinelli and M.E. Toimil-Molares from the GSI Helmholtz Centre for Heavy Ion Research in Darmstadt (Germany) for providing Cu nanowires.

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Authors and Affiliations

  1. CNRS, IM2NP UMR 7334, Aix Marseille University, 13397, Marseille Cedex, France

    Thomas W. Cornelius, Zhe Ren, Francesca Mastropietro, Anton Davydok, Marie-Ingrid Richard & Olivier Thomas

  2. SIMaP, Grenoble Institute of Technology & CNRS, 38402, Saint-Martin d’Hères Cedex, France

    Simon Langlais, Maxime Dupraz, Marc Verdier & Guillaume Beutier

  3. European Synchrotron Radiation Facility (ESRF), 38043, Grenoble Cedex, France

    Marie-Ingrid Richard & Peter Boesecke

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  1. Thomas W. Cornelius
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  2. Zhe Ren
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  3. Francesca Mastropietro
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  4. Simon Langlais
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  5. Anton Davydok
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  6. Marie-Ingrid Richard
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  7. Maxime Dupraz
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  8. Marc Verdier
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  9. Guillaume Beutier
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  10. Peter Boesecke
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  11. Olivier Thomas
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Cornelius, T.W., Ren, Z., Mastropietro, F. et al. In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques. MRS Online Proceedings Library 1712, 63–68 (2014). https://doi.org/10.1557/opl.2014.909

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  • DOI: https://doi.org/10.1557/opl.2014.909

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