Abstract
The effects of segregation of tramp impurities such as sulfur on metal/ceramic bonding is discussed. Microstructural and chemical information is given for the Fe/sapphire interface. The segregation behavior of the interface is evaluated between 500–800 °C. The interfacial structure is shown to be important to the segregation behavior. A possible link between the segregation of sulfur and interface void formation is presented.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
M.G. Nicholas, Ceramic Microstructures 86’-Role of Interfaces, (J.A. Pask and A.G. Evans Eds.), 349, Plenum Press, New York, (1987)
J.G. Smeggil, A.W. Funkenbush, and N. Bornstein, Metall. Trans., 17A, (1986), p. 923
S.Y. Hong, A.B. Anderson, and J.L. Smialek, Surf. Sci., 230, (1990), p. 175
T. Epicier, C. Esnouf, M.A. Smith, and D.P. Pope (submitted Phil. Mag. Letters)
D.P. Pope and M.A. Smith, Developments in Ceramic and Metal-Matrix Composites (TMS conference proceedings to be published Spring 1992)
K.S. Shin and B.H. Tsao, Scripta Met., 22, (1988), p. 585
J. Stringer and G.C. Wood, Adhesion in Solids, (D.M. Maddox, C. Batich, J.E.E. Baglin and R.J. Gottshall eds.) p. 185, Mat. Res. Soc, Pittsburgh (1988)
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Pope, D.P., Smith, M.A. The Effect Of Trace Element Segregation To Fe/Sapphire Interfaces. MRS Online Proceedings Library 238, 427–432 (1991). https://doi.org/10.1557/PROC-238-427
Published:
Issue Date:
DOI: https://doi.org/10.1557/PROC-238-427