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Structures and properties of (001)-oriented Pb(Zr,Ti)O3 films on LaNiO3/Si(001) substrates by pulsed laser deposition

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Abstract

In Pb(Zr0.4Ti0.6)O3 (PZT) (110-nm-thick) films grown on (001)-oriented LaNiO3 (LNO) (50-nm-thick)/Si(001) films by pulsed laser deposition, the microstructures and various structural properties of the PZT and the underlying LNO films were comparatively studied mainly using synchrotron x-ray scattering experiments. Basically, the PZT films resembled the LNO films in microstructure, crystal orientation, and mosaic distribution. The PZT films, however, showed an isotropic structural order (in- and out-of-plane coherence lengths: 18 and 14 nm) in contrast to the anisotropic order of the LNO films (in- and out-of-plane coherence lengths: 5 and 30 nm). The PZT/LNO/Si systems displayed a good hysteresis characteristic (remanent polarization, 11.8 μC/cm2; coercive field, 36.1 kV/cm). We confirmed that oriented PZT films with reasonable ferroelectric properties can be successfully prepared on properly textured LNO films at a relatively low processing temperature.

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Authors and Affiliations

  1. Department of Materials Science and Metallurgical Engineering and Research and Development Center for Automobile’s Parts and Materials, Sunchon National University, 540-742, Sunchon, Korea

    Sang Sub Kim

  2. Department of Materials Science and Engineering, Pohang University of Science and Technology, 790-784, Pohang, Korea

    Tae Soo Kang & Jung Ho Je

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  1. Sang Sub Kim
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  2. Tae Soo Kang
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  3. Jung Ho Je
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Correspondence to Sang Sub Kim.

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Kim, S.S., Kang, T.S. & Je, J.H. Structures and properties of (001)-oriented Pb(Zr,Ti)O3 films on LaNiO3/Si(001) substrates by pulsed laser deposition. Journal of Materials Research 15, 2881–2886 (2000). https://doi.org/10.1557/JMR.2000.0411

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  • DOI: https://doi.org/10.1557/JMR.2000.0411

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