Abstract
Photoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range. Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the technique yields a sizable magnetic contrast even from magnetic films as thin as a fraction of a single monolayer. The combination of chemical selectivity and information depth is successfully employed to investigate the magnetic behavior of buried layers and covered surfaces. This approach offers a convenient access to magnetic coupling phenomena in magnetic sandwiches.
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Acknowledgement
Financial support by the Bundesminister for Bildung und Forschung through grant No. 05 644 EFA is gratefully acknowledged. We are also indepted to A. Wadas and R. Wiesendanger (University of Hamburg) for putting the Permalloy microstructure at our disposal. The CoPt multilayer microstructure was generously supplied by P. Schicketanz and M. Huth from the University of Mainz.
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Schneider, C.M., Frömter, R., Ziethen, C. et al. Magnetic Domain Imaging with a Photoemission Microscope. MRS Online Proceedings Library 475, 381–392 (1997). https://doi.org/10.1557/PROC-475-381
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DOI: https://doi.org/10.1557/PROC-475-381