2013 年 133 巻 10 号 p. 312-313
A method to characterize superconducting thin films by using scanning SQUID microscopy (SSM) is demonstrated. Magnetic field distribution on a film surface with a square defect was calculated and experimental data is also presented. In this paper, principles to observe at a time quantized magnetic flux, shielding current, and defects by SSM is presented.
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