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Licensed Unlicensed Requires Authentication Published by De Gruyter (O) September 25, 2009

EXAFS Spectroscopy – Fundamentals, Measurement Techniques, Data Evaluation and Applications in the Field of Phthalocyanines

  • Venkata Krishnan , Martin P. Feth , Eric Wendel , Yu Chen , Michael Hanack and Helmut Bertagnolli

Abstract

EXAFS spectroscopy is a useful method for determining the local structure around a specific atom in disordered systems. This technique provides information about the coordination number, the nature of the scattering atoms surrounding a particular absorbing atom, the interatomic distance between the absorbing atom and the backscattering atoms, and Debye–Waller factor. The measurements are done with high energy X-rays, which are normally generated by synchrotron radiation sources. The data analysis is facilitated by specially developed program packages suitable for evaluation purposes. EXAFS spectroscopy is employed in several fields for a variety of applications. Here the structural characterization of a series of amorphous μ-oxo-bridged metallophthalocyanine dimers is presented. It is found that the phthalocyanine macrocycle has significant influence in the spectra and the results obtained are in agreement with the well-known structure of phthalocyanine complexes.

Published Online: 2009-9-25
Published in Print: 2004-1-1

© 2004 Oldenbourg Wissenschaftsverlag GmbH

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