Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

A. M. Milinda Abeykoon; Christos D. Malliakas; Pavol Juhás; Emil S. Bozin; Mercouri G. Kanatzidis; Simon J. L. Billinge

doi:10.1524/zkri.2012.1510

Published by De Gruyter (O) March 22, 2012

Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

A. M. Milinda Abeykoon , Christos D. Malliakas , Pavol Juhás , Emil S. Bozin , Mercouri G. Kanatzidis and Simon J. L. Billinge

From the journal Zeitschrift für Kristallographie - Crystalline Materials

https://doi.org/10.1524/zkri.2012.1510

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Abstract

Quantitatively reliable atomic pair distribution functions (PDFs) have been obtained from nanomaterials in a straightforward way from a standard laboratory transmission electron microscope (TEM). The approach looks very promising for making electron derived PDFs (ePDFs) a routine step in the characterization of nanomaterials because of the ubiquity of such TEMs in chemistry and materials laboratories. No special attachments such as energy filters were required on the microscope. The methodology for obtaining the ePDFs is described as well as some opportunities and limitations of the method.

Keywords: pair distribution function; electron diffraction; nanomaterials; diffraction; polycrystalline films

^* Correspondence address: Brookhaven National Laboratory, Condensed Matter Physics and Materials Science Dep, P.O. Box 5000, Upton, NY 11973, U.S.A., aabeykoon@bnl.gov

Published Online: 2012-03-22

Published in Print: 2012-05

Quantitative nanostructure characterization using atomic pair distribution functions obtained from laboratory electron microscopes

Abstract

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