Abstract

Quantitative phase microscopy (QPM) literally images the quantitative phase shift associated with image contrast, where the phase shift can be altered by laser heating. In this study, the thermal conductivity and thermo-optic coefficient (TOC) of a transparent substrate are simultaneously determined by measuring the phase difference induced by an external heating laser using a QPM setup. The substrates are coated with a 50-nm-thick titanium nitride film to photothermally generate heat. Then, the phase difference is semi-analytically modeled based on the heat transfer and thermo-optic effect to simultaneously extract the thermal conductivity and TOC. The measured thermal conductivity and TOC agree reasonably well, indicating the potential for measuring the thermal conductivities and TOCs of other transparent substrates. The concise setup and simple modeling differentiate the advantages of our method from other techniques.

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