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Instrument for the Absolute Measurement of Direct Spectral Reflectances at Normal Incidence

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Abstract

An accurate but simple reflectometer is described for measuring the spectral reflectances at normal incidence of flat, specularly reflecting surfaces. The instrument has a wavelength range of 0.2–2.5 μm and, with transparent samples, provides for simultaneous measurement of spectral transmittances.

© 1964 Optical Society of America

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