Response to “Comment on ‘Minority Carrier Lifetime Measurements in Epitaxial Silicon Layers’” [T. Hara, F. Tamura, and T. Kitamura (pp. L54–L57, Vol. 144, No. 4, 1997)]

Journal of The Electrochemical Society

Response to "Comment on 'Minority Carrier Lifetime Measurements in Epitaxial Silicon Layers'" [T. Hara, F. Tamura, and T. Kitamura (pp. L54–L57, Vol. 144, No. 4, 1997)]

T. Hara¹, F. Tamura¹ and T. Kitamura¹

© 1998 ECS - The Electrochemical Society
Journal of The Electrochemical Society, Volume 145, Number 6 Citation T. Hara et al 1998 J. Electrochem. Soc. 145 2205a DOI 10.1149/1.1838618

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¹ Department of Electrical Engineering, Hosei University, Tokyo 184, Japan

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