Stability of Iron‐Silicide Precipitates in Silicon

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© 1997 ECS - The Electrochemical Society
, , Citation Deepak A. Ramappa and Worth B. Henley 1997 J. Electrochem. Soc. 144 4353 DOI 10.1149/1.1838192

1945-7111/144/12/4353

Abstract

A quantitative analysis of iron‐silicide precipitate stability with respect to time and temperature is presented. Iron precipitation and dissolution in silicon was analyzed by a quantitative assessment of change in interstitial iron using a surface photovoltage minority carrier lifetime/diffusion length analysis technique. Interstitial iron is shown to rapidly precipitate to the silicide phase between 500 and 600°C. Iron‐silicide precipitates were found to dissolve above a temperature of 760°C. Dissolution of precipitates releases iron back to an interstitial position in the silicon matrix. The amount of precipitate dissolved was found to be a function of dissolution process temperature and time. It is concluded that the precipitate phase of iron, , is thermally unstable above a temperature of 760°C.

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10.1149/1.1838192