Abstract
The dielectric relaxation model for ion current transients is tested against both new data obtained under potentiostatic conditions and data obtained by Dewald under galvanostatic conditions. A single set of system constants reproduces both sets of data. As has been already shown for the system 
, some of the system constants appear to vary slightly with film formation conditions, a possible consequence of minor structural or compositional changes. The results of a‐c impedance measurements made during steady‐state film growth were also reproduced by the same set of system constants for frequencies below 1 kHz. Above 1 kHz, an anomalous increase in a‐c conductance with increasing frequency was observed.