Abstract
Chromium conversion coating (CCC) formation was monitored on copper‐containing aluminum alloys AA2024-T3 and a specially cast 
ingot using Raman spectroscopy of the 
band. The 
ingot's different phases were compositionally analyzed with energy‐dispersive spectroscopy (EDS) and Auger electron spectroscopy (AES) before and after treatments using commercial Alodine™ 1200S chromium solution. Profilometry and Raman intensity of the 
band were used to gauge CCC film thickness on AA-2024-T3 alloy. A linear relationship between CCC thickness and the integrated 
band was shown to exist on AA-2024 alloy. Raman intensity of the 
band was also integrated and spatially mapped using commercially available software. These results were verified with AES depth profiling using an 
ion sputter. CCC formation was found to be slower on the 
phases with higher copper content. Similarly, in 2024-T3, CCC formation was suppressed on S‐phase 
and "depressed" 
intermetallics of 2024 aluminum alloy. 
adsorption on the 
ingot phases, Cu, Al, Mg, and AA2024-T3 were characterized by Raman in the 
range. © 2000 The Electrochemical Society. All rights reserved.