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Placement of 3D ICs with thermal and interlayer via considerations

Published:04 June 2007Publication History

ABSTRACT

Thermal problems and limitations on interlayer via densities are important design constraints on three-dimensional integrated circuits (3D ICs), and need to be considered during global and detailed placement. Analytical and partitioning-based techniques are developed to explore the tradeoff between wirelength, interlayer via counts, and thermal effects. This method allows wirelengths to be minimized for any desired interlayer via density and temperatures to be reduced while minimizing deleterious effects on wirelength and interlayer via counts. Wirelength reductions within 2% of the optimal can be achieved using 46% fewer interlayer vias. Temperatures can be reduced by about 20% with only 1% higher wirelengths and 10% more interlayer vias.

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          cover image ACM Conferences
          DAC '07: Proceedings of the 44th annual Design Automation Conference
          June 2007
          1016 pages
          ISBN:9781595936271
          DOI:10.1145/1278480

          Copyright © 2007 ACM

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          Publication History

          • Published: 4 June 2007

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          DAC '07 Paper Acceptance Rate152of659submissions,23%Overall Acceptance Rate1,770of5,499submissions,32%

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