Erratum: "Mitigation of Complementary Metal–Oxide–Semiconductor Variability with Metal Gate Metal–Oxide–Semiconductor Field-Effect Transistors"
Ji-Woon Yang1, Chang Seo Park2, Casey E. Smith2, Hemant Adhikari2, Jeff Huang2, Dawei Heh2, Prashant Majhi2 and Raj Jammy2
Published 31 October 2011 •
Copyright (c) 2011 The Japan Society of Applied Physics
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Citation Ji-Woon Yang et al 2011 Jpn. J. Appl. Phys. 50 119201
DOI 10.1143/JJAP.50.119201
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