Fabrication of High-Intensity Light-Emitting Diodes Using Nanostructures by Ultraviolet Nanoimprint Lithography and Electrodeposition

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Published 15 February 2008 Copyright (c) 2008 The Japan Society of Applied Physics
, , Citation Hiroshi Ono et al 2008 Jpn. J. Appl. Phys. 47 933 DOI 10.1143/JJAP.47.933

1347-4065/47/2R/933

Abstract

Antireflection nanostructures for GaN light-emitting diodes (LEDs) were fabricated by reactive ion etching (RIE) using Ni as an etching mask. The Ni mask was formed by electrodeposition in combination with ultraviolet nanoimprint lithography (UV-NIL). The antireflection nanostructures of 600 nm in depth, 300 nm in diameter, and 500 nm in pitch were fabricated on a GaN substrate. The radiant intensity of the LEDs was increased 1.5 times compared to that of a conventional LED. Since this method enables the fabrication of wafer-level GaN nanostructures with a low cost process, it is applicable to the fabrication of photonic crystals.

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10.1143/JJAP.47.933