Transmission Electron Microscope Observation by Surface Replica Method for Layer Undulation in Solid X1 Phase of Banana Molecule

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Published 6 June 2007 Copyright (c) 2007 The Japan Society of Applied Physics
, , Citation Sungmin Kang et al 2007 Jpn. J. Appl. Phys. 46 3518 DOI 10.1143/JJAP.46.3518

1347-4065/46/6R/3518

Abstract

The smectic X1 phase formed from the banana 4-bromo-1,3-phenylenebis[4-(4-n-tetradecanoxyphenyliminomethyl)benzoate] (4Br-P-14-O-PIMB) molecule, possesses a distinct two-dimensional structure with a long-range density modulation of ∼17.5 nm along the layer. The X1 phase is formed upon cooling from the well-known B2 phase, and then its characteristic modulated structure is retained at room temperature. A transmission electron microscopic (TEM) observation was performed for shadowed replica film which imprints the surface structure of the homeotropically aligned X1 phase. The modulation was detected as clear stripes with periodicities ranging from 15 to 18 nm, which agree with the modulation length determined by X-ray measurement. The results confirm that the periodicity along the layer is not due to the simple density modulation occurring within a smooth layer, but can be explained by the layer undulation that creates the crests and troughs.

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10.1143/JJAP.46.3518